Hitachi High Technologies Europe GmbH

 

Our company represents Hitachi High-Tech Science cooperation located in Tokyo, Japan. We are providing X-Ray based analytical instruments (XRF) for destruction-free analysis of thin layer structures with more than 30 years of experience. The main applications are focusing on the measurement of film thickness and elemental composition in research and quality control for electronic industry. Film thicknesses in nm-Range can be determined with high local resolution by employing polycapillary X-Ray optics. Furthermore the detection limits for trace elements are in the low ppm-range. Additionally Thermal Analysis equipment (DSC, TGA, TMA, DMA) can be employed to estimate the behavior of layer-substrate compounds at different temperature regimes.