Digital Surf has been developing surface imaging, analysis & metrology software for profilers and microscopes since 1989.
We provide software solutions for analyzing images and other data from a wide range of instruments including:
- Atomic Force Microscopes (AFM) and other Scanning Probe Microscopes (SPM)
- Scanning Electron Microscopes (SEM)
- 3D confocal and interferometric microscopes/profilers
- And more
Mountains® software is offered by the majority of profilometer and microscope manufacturers worldwide, embedded in their equipment or available as an option.
Application areas include: automotive, material science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.
Image Metrology, editor of SPIP® software for SPM image processing, is now part of the Digital Surf group.
16 rue Lavoisier