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Modelling and characterization

I

European Nanoanalysis Symposium (9th Dresden Nanoanalysis Symposium “on tour”)

Motto: Correlative Materials Characterization

Scope:

More than ever before, materials-driven product innovations in industry and shorter time-to-market introductions for new products require high advancement rates and a tight coupling between research, development and manufacturing. Analytical techniques and respective tools, particularly to investigate nanomaterials, are considered to be fundamental drivers for innovation in industry.

Research and development in materials characterization techniques are increasingly needed for modern materials science, for innovation in high-tech branches and to guarantee the functionality, performance and reliability of advanced products. The sustained progress in materials science and engineering is increasingly driven by computational materials science, multi-scale modeling and characterization. With this symposium, we would like to address the particular topic "correlative materials characterization" which will expand correlative microscopy by including diffraction, spectroscopy and in-situ techniques. Advanced data analysis, particularly artificial intelligence algorithms, will be an important part of the scope of the symposium. Indeed many analytical techniques are becoming high speed and high throughput, thanks to new sources and advanced detectors, generating huge amounts of data that calls for new data treatment strategies.  At the same time, the ability of machine learning methods to detect patterns in large data sets is instrumental for the extraction of previously hidden relationships between the spectroscopic features and materials’ structure, composition and morphology.

As a consequence, this symposium will cover data acquisition and data analysis of nano-scale materials along the whole value and innovation chain, from fundamental research up to industrial applications. It will bring materials scientists and computer scientists together from universities, research institutions, equipment manufacturers and industrial end-users. New results from the combined utilization of analytical techniques will be reported in several talks and in the poster sessions, and novel solutions in the field of materials characterization and data analysis for process and quality control will be shown. The discussions and interactions between the stakeholders will help to identify gaps in the fields of correlative materials characterization and to propose actions to close them and to support industrial exploitation of innovative materials. The symposium aims at reinforcing ongoing collaborations and discussing ideas for new collaborations.

 
Invited talks of the symposium will be given by:
  • Stefan Hell (Nobel Laureate in Chemistry 2014), Max Planck Institute for Biophysical Chemistry, Göttingen, Germany
    "MINFLUX nanoscopy and related matters"
  • Jan Neuman, CEO and Founder of NenoVision s.r.o., Brno, Czech Republic
    "True correlative material characterization techniques using AFM in SEM for a broad range of applications"
  • Jean Susini, Scientific Director at SOLEIL, Saclay, France
    "Ultra-low emittance synchrotron storage rings: New opportunities for correlative materials characterization"
  • Thomas Schmidt, Fritz-Haber Institute, Berlin, Germany
    "Spectromicroscopy: a tool for in situ studies of electrochemistry and thermal reactions"
 
Scientific committee:
  • Jiri Cejka, Charles University Prague (Czech Republic)
  • Anatoly Frenkel, Stony Brook University/NY (USA)
  • Narciso Gambacorti, CEA LETI MINATEC, Grenoble (France)
  • Wolfgang Jäger, University of Kiel (Germany)
  • Kristina Kutukova, Fraunhofer IKTS Dresden (Germany)
  • Eckhard Langer, GLOBALFOUNDRIES, Dresden (Germany)
  • Malgorzata Lewandowska, Warsaw University of Technology, Warsaw (Poland)
  • Rodrigo Martins, Universidade Nova de Lisboa, Lisbon (Portugal)
  • Subodh Mhaisalkar, NTU Singapore (Singapore)
  • Kristian Moelhave, DTU Nanolab, Lyngby (Denmark)
  • Marie-Ingrid Richard, CEA & ESRF Grenoble (France)
  • Peter Sachsenmeier, Hankou University Wuhan (China)
  • Sabrina Sartori, University of Oslo (Norway)
  • Marco Sebastiani, Universite Roma Tre, Rome (Italy)
  • Robert Sinclair, Stanford University, Palo Alto/CA (USA)
  • Gerd Schneider, Helmholtz-Zentrum Berlin (Germany)
  • Alex Ulyanenkov, Atomicus LLC, Seattle/WA (USA).

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Symposium organizers
Ehrenfried ZSCHECH (Main organizer)deepXscan GmbH

Theaterstr. 4, 01067 Dresden, Germany

ehrenfried.zschech@deepxscan.com
Eva OLSSONChalmers University of Technology

Department of Physics, 412 96 Gothenburg, Sweden

eva.olsson@chalmers.se
Janis TIMOSHENKOFritz Haber Institute of the Max Planck Society

Interface Science Department - Faradayweg 4-6, 14195 Berlin, Germany

janis@fhi-berlin.mpg.de
Olivier THOMASAix Marseille Université

CNRS IM2NP - 13397 Marseille Cedex 20, France

olivier.thomas@im2np.fr