Modelling and Characterisation
VAdvanced x-ray techniques for materials characterizations: from in-house instrumentations to large-scale synchrotron facilities
Following demands of advanced x-ray techniques provided by in-house equipment and large-scale x-ray facilities for materials studies, the symposium will be dedicated to basic concepts of instrumentations, their in- and ex- situ determinations of electronic, morphological and crystal structures etc.
Scope:
The booming advanced functional, engineering, and structural materials require cutting-edge but non-destructive characterization techniques to probe their electronic, micro-, and morphological structures beyond their unique functionalities. However, conventional in-house characterizations fall short of micro- and electronic structural probations for bulk engineering materials, nanomaterials, and these materials during the processing or operations. Enabled by high-brilliance and time resolved features, synchrotron techniques serve cutting-edge tools which are exactly meeting stringent characterization requirements. The latest development of in-house but miniaturized equipment, mimicking these of synchrotron, provide complementary but more localized access to the probations previously only available in large-scaled peers.
This symposium is thus aimed at strengthening interactions between scientists in materials and x-ray photon fields. It covers topics in x-ray characterizations of materials which are developed for electronic and optoelectronic devices (including flexible ones), transport properties, photovoltaic applications, catalysis, energy harvesting and storage, ferroic, and even structural materials. More emphasis is paid on in and ex situ spectroscopic, microscopic, and crystallographic studies of mechanisms that drive synthesis and functionalities. The symposium is hoped to act as a platform to introduce the latest advances in x-ray techniques to materials scientists, whose demands in turn are expected to inspire instrumentation development by scientists dedicated to methodological developments.
Hot topics to be covered by the symposium:
- Instrumentational advances in synchrotron and in-house x-ray devices for materials characterizations
- Materials processing monitored through spectroscopies, microscopies, and photon and diffractions
- In situ and operando spectro-, micro-, and microspectroscopic studies of energy materials during their operations
- Computational and theoretical algorithms to treat data generated from synchrotron and in house devices
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Institute of Solid State Physics, Kengaraga 8, Riga LV-1063, Latvia
popov@latnet.lvFotongatan 2, 22484 Lund, Sweden
karina.thanell@maxiv.lu.seNano and Molecular Systems Research Unit, Pentti Kaiteran katu 1, 90570 Oulu, Finland
wei.cao@oulu.fiUniversytetska St., 55A, 69011, Zaporizhia, Ukraine
yanasuchikova@gmail.com