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Advanced quantitative transmission electron microscopy: materials research in several dimensions

By highlighting the recent advances in scanning/transmission electron microscopy as a multidimensional tool on the atomic scale this symposium aims at fostering collaborative research between the electron microscopy and materials science communities. Current topics will be highlighted in keynote presentations given by leading invited experts.


Scanning/transmission electron microscopy has developed to a multi-dimensional tool, i.e. (simultaneous) acquisition of atomic structure images, chemical composition, bonding information, internal electromagnetic fields, optical information and  time-resolved processes become feasible, also under an external stimuli (such as stress, electric biasing, heating, light,…). The wealth of information on physical, chemical, electronic, optical and magnetic properties on the atomic scale is a key to materials research and future technological developments. However, precisely correlating physical properties of materials with their nanofeatures requires a multidisciplinary approach of method development in electron microscopy, input of macroscopic data and ab-initio theory.

The symposium will address but is not limited to the following topics of interest:

  • advanced quantitative electron microscopy (EM) methods – strategies and applications: In-situ EM measurements, electron tomography, scanning-transmission EM, diffractive imaging and diffraction, aberration-corrected EM, electron holography, electron nanospectroscopic techniques for local bonding and elemental mapping and determination of optical properties, quantitative comparisons (experiment versus theory)
  • electron microscopy for the characterization of the growth and structure of nanoscale materials, such as nanowires, nanotubes, particles, thin films and interfaces
  • in-situ manipulation and characterization of nanomaterials and processed by external stimuli
  • electron microscopy of functional nanocomposites,  energy materials and quantum materials
  • electron microscopy of organic-inorganic interfaces for molecular and electronic applications

Important topics will be highlighted in keynote presentations given by leading invited experts. Contributions are solicited that feature applications of quantitative electron microscopy to all different classes of materials.

Hot topics to be covered by the symposium:

The scientific sessions (incl. poster sessions) are grouped into the following clusters covering state-of-the-art characterization / using quantitative electron microscopy (EM) for topic areas of materials science:

  • 3D imaging: Form soft matter to functional materials.
  • In-situ microscopy on battery materials, catalysts and growth phenomena
  • Magnetic and piezoelectric materials: Measuring fields and charges
  • Spectroscopy with electrons: phonons, plasmons and bonding
  • (2D) Quantum materials

List of invited speakers:

  • Sandra van Aert (University of Antwerp, Belgium) Quantitative STEM
  • Sarah Haigh (Manchester, UK) 2d-Quantum Materials
  • Federico Panciera (CNRS, University of Paris-Saclay, France) In-situ Tem observation of III-V Nanowire growth
  • Quentin Ramasse (Daresbury, UK) Functional imaging
  • Josef Zweck (Regensburg, Germany) Magnetic field distributions

List of scientific committee members:

  • Hamish Fraser
  • Ferdinand Hofer
  • Joachim Mayer
  • Maria Varela
  • Wayne Kaplan
  • Barry Carter
  • Jo Verbeek
  • David Bell
  • Miran Ceh
  • Aleksandra Czyrska-Filemonowicz

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Symposium organizers
Eva OLSSONChalmers University of Technology

Department of Physics, 412 96 Gothenburg, Sweden

+46 31 772 3247
Martina LUYSBERGResearch Centre Jülich

Ernst Ruska-Centre, Wilhelm-Johnen-Str, D-52425 Jülich, Germany

+49 2461 612417

Laboratoire de Physique des Solides, Bâtiment 510, Université Paris Sud, 91405 Orsay, France

+33 169155361
Paul MIDGLEYUniversity of Cambridge

Department of Materials Science and Metallurgy, 27 Charles Babbage Road, Cambridge, CB3 0FS, UK.

+44 1223 334561