Nanoscale Phenomena & Low-dimensional Materials
IIALTECH 2027 – Analytical Techniques for Accurate Nanoscale Characterization
Metrology is a cornerstone in the development of novel nanoscale materials, enabling accurate correlations between structure, properties, and functionality while driving accelerated innovation. Contributions are expected to highlight how advanced and innovative analytical techniques provide profound insights into emerging materials, unlocking their full potential.
Scope:
This symposium will convene international experts to advance hybrid and correlative metrology for functional and energy‑relevant materials, emphasizing multi‑parameter, multi‑method approaches, integrated data analysis strategies, and reproducible workflows. Sessions will address metrology for clean-energy materials (conversion and storage, such as photovoltaics and batteries), semiconductor and quantum materials and devices, including critical raw and recycled materials and analytical approaches to interfaces and interphases critical to device performance and longevity. Topics include high‑resolution scanning probe methodologies (AFM, SNOM, Kelvin probe, tip‑enhanced optical spectroscopies), mapping and depth profiling for organic, hybrid and inorganic semiconductors and energy materials; X‑ray diffraction, scattering, tomography and spectrometry applied to nanostructured and advanced materials; and advanced optical spectroscopy, ultramicroscopy, interferometric and non‑interferometric techniques. Developments in ion beam characterization of lateral and vertical thin films (MEIS, RBS, TOF‑SIMS, SIMS), surface chemistry analysis (XPS, NEXAFS, EELS) and functionalized surfaces will be highlighted alongside correlative multimodal imaging and spectroscopy. Emphasis will be placed on nanometrology—ex‑situ, in‑situ, and operando methods—as well as the development and dissemination of reference materials, calibration samples, validated standards, and robust hybrid correlative workflows (including multi-parameter, multi-method and AI-enabled data fusion) enabling traceability and quantitative comparison. The symposium will also explore measurement challenges for nanomaterials in complex matrices, including standardized protocols for health, safety and environmental assessment, statistical treatment of heterogeneous samples, and analytical methods for probing buried interfaces in energy devices. Through interdisciplinary sessions, and discussions on best practices and standardization, the program aims to foster methodological innovation, cross‑disciplinary collaborations, and community consensus to enable reliable, quantitative characterization of next‑generation functional materials and devices.
Hot topics to be covered by the symposium:
- Hybrid correlative metrology, AI‑enabled data fusion, traceable reference materials and standards for reproducible quantitative analysis.
- Operando/in‑situ nanometrology methods and calibration for materials and devices in complex environments
- Advanced scanning probe and optical spectroscopy techniques
- Metrology for clean energy, quantum and semiconductors materials and devices
- X‑ray/tomography/scattering, ion‑beam methods, XPS/NEXAFS/EELS for surfaces, interfaces, bulks
- Defect, stress and strain profiling and mapping of functional materials
- Metrology for critical raw and recycled materials, and for environmental particles
No abstract for this day
No abstract for this day
No abstract for this day
No abstract for this day
No abstract for this day
Abbestrasse 2-12, 10587 Berlin, Germany
burkhard.beckhoff@ptb.deHampton Road, Teddington TW11 0LW, U.K.
fernando.castro@npl.co.ukPavillon Tapan-K.-Bose, 3351, Boul. des Forges C.P.500, Trois-Rivières (Québec) G9A 5H7, Canada
karin.kleiner@inrs.caP.le Alod Moro 5 00185 Roma, Italy
sergio.brutti@uniroma1.it