Nanoscale Phenomena & Low-dimensional Materials
JJFrontiers of Imaging and Spectroscopy in Transmission Electron Microscopy
By highlighting the recent advances in scanning/transmission electron microscopy as a multidimensional tool on the atomic scale this symposium aims at fostering collaborative research between the electron microscopy and materials science communities. Current topics will be highlighted in keynote presentations given by leading invited experts.
Scope:
Characterization lies at the heart of materials science research. The discovery of new properties, the design and engineering of materials, the quantification of defects, and the understanding of material physics and chemistry each require robust methods to measure structure and properties across length scales, from the macroscopic down to the atomic. Transmission electron microscopy (TEM) is one of the most powerful characterization tools used by materials scientists, largely because it offers unmatched spatial resolution and remarkable flexibility. With the implementation of aberration correctors, the spatial resolution of electron microscopes has been drastically improved. These advances have been further complemented by faster, more sensitive direct electron detectors, in-situ and operando capabilities, and monochromated electron sources for electron spectroscopy. As a result, we can now investigate materials with unprecedented resolution, sensitivity, and precision.
Indeed, recent advances in TEM have significantly enhanced spatial and energy resolutions, pushing them to levels better than 50 pm and 5 meV, respectively. The advent of aberration-corrected TEM has played a crucial role in achieving these remarkable resolutions. This technology has not only improved imaging quality but has also paved the way for a plethora of in-situ experiments, novel imaging techniques, and multi-dimensional data acquisitions at atomic scales. Moreover, the integration of faster or more sensitive detectors with cutting-edge data analytics and machine learning techniques has further revolutionized the field. These advances are particularly significant for studying beam-sensitive materials and liquids, allowing researchers to probe them with unprecedented precision and detail. By combining high-resolution imaging with advanced data analysis methods, scientists can extract valuable insights into the structural and dynamic properties of solid materials and liquids, even under challenging experimental conditions. Overall, these developments represent a paradigm shift in TEM capabilities, opening new frontiers in nanoscience and materials research with unparalleled resolution and sensitivity.
In this symposium, we will cover a broad range of cutting-edge topics in transmission electron microscopy, cryogenic techniques, in-situ/operando TEM, and multi-dimensional spectroscopy and imaging. We also welcome contributions in computer-aided data acquisition, image analysis, and big-data processing, including algorithms based on artificial intelligence (machine and deep learning, neural networks, and related approaches). The goal of this symposium is to bring together researchers from the microscopy and materials science communities to foster new collaborations and accelerate the development of novel functional materials and devices.
Hot topics to be covered by the symposium:
- Transmission Electron Microscopy
- New Detectors and TEM Instrumentation
- AI for Electron Microscopy
- 4D-STEM & Ptychography
- Cryo-TEM
- Analytical (S)TEM
- In-Situ and operando TEM
- Vibrational Electron Energy-Loss Spectroscopy
- Imaging and spectroscopy: from soft matter to functional materials
- Sample preparation techniques
- Theory and Modeling of Materials
- Ultrafast Electron Microscopy
- Quantitative TEM Analysis of Materials
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Newtonstraße 15, 12489 Berlin, Germany
Christoph.Koch@hu-berlin.deDepartment of Physics, 412 96 Gothenburg, Sweden
eva.olsson@chalmers.seHeisenbergstr. 1, 70569 Stuttgart, Germany
hgwang@fkf.mpg.deNo.29 Jiangjun Road, Jiangning, 211106 Nanjing, China
wang.yi@nuaa.edu.cn